发明名称 |
Methods and devices for evaluating the thermal exposure of a metal article |
摘要 |
A method for evaluating the thermal exposure of a selected metal component which has been exposed to changing temperature conditions is described. The voltage distribution on a surface of the metal component, or on a metallic layer which lies over the component, is first obtained. The voltage distribution usually results from a compositional change in the metal component. The voltage distribution is then compared to a thermal exposure-voltage model which expresses voltage distribution as a function of exposure time and exposure temperature for a reference standard corresponding to the metal component. In this manner, the thermal exposure of the selected component can be obtained. A related device for evaluating the thermal exposure of a selected metal component is also described.
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申请公布号 |
US7654734(B2) |
申请公布日期 |
2010.02.02 |
申请号 |
US20050126793 |
申请日期 |
2005.05.10 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
JIANG LIANG;KOOL LAWRENCE BERNARD;JACKSON MELVIN ROBERT;HARDWICKE CANAN USLU;ZHAO JI-CHENG;RITTER ANN MELINDA;LEE CHING-PANG |
分类号 |
G01N25/72;G01K3/00;G01N17/00 |
主分类号 |
G01N25/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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