发明名称 Methods and devices for evaluating the thermal exposure of a metal article
摘要 A method for evaluating the thermal exposure of a selected metal component which has been exposed to changing temperature conditions is described. The voltage distribution on a surface of the metal component, or on a metallic layer which lies over the component, is first obtained. The voltage distribution usually results from a compositional change in the metal component. The voltage distribution is then compared to a thermal exposure-voltage model which expresses voltage distribution as a function of exposure time and exposure temperature for a reference standard corresponding to the metal component. In this manner, the thermal exposure of the selected component can be obtained. A related device for evaluating the thermal exposure of a selected metal component is also described.
申请公布号 US7654734(B2) 申请公布日期 2010.02.02
申请号 US20050126793 申请日期 2005.05.10
申请人 GENERAL ELECTRIC COMPANY 发明人 JIANG LIANG;KOOL LAWRENCE BERNARD;JACKSON MELVIN ROBERT;HARDWICKE CANAN USLU;ZHAO JI-CHENG;RITTER ANN MELINDA;LEE CHING-PANG
分类号 G01N25/72;G01K3/00;G01N17/00 主分类号 G01N25/72
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