发明名称 Laser processing device, laser processing temperature measuring device, laser processing method and laser processing temperature measuring method
摘要 The object is to provide a laser processing apparatus, a laser processing temperature measuring apparatus, a laser processing method, and a laser processing temperature measuring method which can highly accurately detect the processing temperature when carrying out processing such as welding with laser light. A laser processing apparatus 1A for processing members. DR, UR to be processed by irradiating the members with laser light LB comprises a laser (semiconductor laser unit 20A) for generating the laser light LB; optical means for converging the laser light LB generated by the laser onto processing areas DA, UA; and a filter 30, disposed between the members DR, UR to be processed and the optical means, for blocking a wavelength of fluorescence generated by the optical means upon pumping with the laser light LB; wherein light having the wavelength blocked by the filter 30 is used for measuring a temperature of the processing areas DA, UA.
申请公布号 US7651264(B2) 申请公布日期 2010.01.26
申请号 US20050518392 申请日期 2005.07.25
申请人 HAMAMATSU PHOTONICS K.K. 发明人 MATSUMOTO SATOSHI;KOSUGI TSUYOSHI
分类号 B23K26/00;G01J5/08;B23K26/03;B23K26/06;B23K26/32;B23K26/40;B23K26/42;B29C65/00;B29C65/16;G01J5/06;G01N25/00;H01S3/00 主分类号 B23K26/00
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