| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an organic EL element measurement method for executing higher level measurements of an organic EL element. Ž<P>SOLUTION: An organic EL element is measured, before covering it with a sealing member; with the EL element emitting light, a light emission measuring means thereto applies a light from the translucent substrate side, to measure the polarized state of the light reflected by the EL element. With the EL element prevented from emitting light, a non-light emission measuring means thereto applies light from the translucent substrate side to measure the polarized state of the light reflected by the EL element; a light emission calculating means calculates the optical constants of a film, based on the polarized state of the light measured by the light emission measuring means; a non-light emission calculating means calculates the optical constant of the film, based on the polarized state of the light measured by the non-light emission measuring means; and an output means outputs a difference or ratio between the optical constants calculated by the light emission calculating means and by the non-light emission calculating means, respectively. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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