发明名称 METHODS FOR DEFINING EVALUATION POINTS FOR OPTICAL PROXIMITY CORRECTION AND OPTICAL PROXIMITY CORRECTION METHODS INCLUDING SAME
摘要 Methods are disclosed for defining evaluation points for use in optical proximity correction of a rectangular target geometry. A method for defining evaluation points for use in optical proximity correction of a rectangular target geometry may comprise predicting a contour of an image to be produced in an optical proximity correction simulation of a target geometry. The target geometry may comprise a plurality of line segments, each line segment of the plurality having one evaluation point defined thereon. The method may further comprise shifting at least one evaluation point to an associated point on the predicted contour of the image.
申请公布号 US2010017778(A1) 申请公布日期 2010.01.21
申请号 US20080174171 申请日期 2008.07.16
申请人 MICRON TECHNOLOGY, INC. 发明人 FUTRELL JOHN R. C.;RUSSELL EZEQUIEL VIDAL;STANTON WILLIAM A.
分类号 G06F17/50 主分类号 G06F17/50
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