<p>Provided is a solid-state imaging element having a configuration effective for improving sensitivity by reducing a light collection loss and increase of color mixing caused by increase of the angle of the incident light into a waveguide upon an oblique incidence. The solid-state imaging element includes: a Si substrate (6); a plurality of unit pixels arranged on the Si substrate (6); a wire layer (4) formed on the unit pixels; an optical waveguide region (401) penetrating the wire layer (4) formed on an photoelectric conversion region contained in the unit pixels; and a light collection element (501) formed on the optical waveguide region (401). The light collection element (501) is a refractive-index-distributed type microlens having an effective refractive index distribution.</p>
