| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an array test apparatus having a structure that shortens a test time of the test apparatus and that ensures lining-up of components composing a test module. Ž<P>SOLUTION: The array test apparatus has a loading part which has a plurality of loading plates supporting a panel to be tested, from underside simultaneously, and being made apart from each other, a testing part which is provided adjacently to the loading part in the direction of a first axis and tests the panel transferred from the loading part with respect to an electrical defect, and a panel transfer assembly which transfers the panel being sucked on the underside from the loading part to the testing part. The panel transfer assembly has a guide rail provided in the direction of the first axis between the loading plates, a first moving member so connected to the guide rail as to be movable in the direction of the first axis, a second moving member so connected to a first driving member as to be movable in the direction of a second axis intersecting the direction of the first axis, and a suction block connected to the second moving member. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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