| 摘要 |
The present invention relates to a method of using an atomic force microscope comprising exciting natural lower and higher vibration modes of a microlever (M) placed on a sample, and analyzing the variation of one variable of a first output signal (Ai cos(omegait-phii)) representative of the response of M to the excitation of the lower mode, with respect to the variation of a parameter influenced by one variable of a second output signal (Aj cos(omegajt-phij)) representative of the response of M to the excitation of the higher mode, and/or analyzing the variation of one variable of a second output signal (Aj cos(omegajt-phij)) representative of the response of M to the excitation of the higher mode, with respect to the variation of a parameter influenced by one variable of a first output signal (Ai cos(omegait-phii)) representative of the response of M to the excitation of the lower mode.
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