| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor test module capable of inexpensively testing a semiconductor device having an ADC circuit. Ž<P>SOLUTION: The semiconductor test module includes a structure in which a semiconductor device 5 is mounted on a test board 10 connected to an external tester 11 together with an analog input signal generating unit 2 for generating an analog signal to input the analog signal into the test target semiconductor device 5 with an ADC circuit 5a, a conversion result storing unit 3 for storing results of conversion of the ADC circuit 5a and a decision unit 4 for determining whether the ADC circuit 5a is defective, based on the results of conversion. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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