发明名称 ABNORMALITY DETERMINATION ASSISTANCE METHOD OF REACTION PROCESS DATA AND AUTOMATIC ANALYZER
摘要 <p><P>PROBLEM TO BE SOLVED: To overcome the problem that time and effort are spent since a laboratory technician needs to confirm abnormal reaction process data one by one and estimate an abnormal cause if an abnormality is suspected in an apparatus, a sample and a reagent. <P>SOLUTION: An abnormality determination assistance method includes: an index calculating means for applying a preset evaluation formula to time-series data of a photometrical value, and calculating an index for indicating the characteristic quantity of a particular waveform; a relative index calculating means for calculating a value for indicating a relationship between the previously-calculated index and the index of target data; and an index displaying means for simultaneously displaying the value calculated by the index calculating means and the value calculated by the relative index calculating means. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010008402(A) 申请公布日期 2010.01.14
申请号 JP20090094057 申请日期 2009.04.08
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 MITSUYAMA SATOSHI;FUKUYAMA SUKETAKA;TAKADA HIDEKATSU;BAN HIDEYUKI;MIMURA TOMONORI
分类号 G01N35/00 主分类号 G01N35/00
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