发明名称 |
ABNORMALITY DETERMINATION ASSISTANCE METHOD OF REACTION PROCESS DATA AND AUTOMATIC ANALYZER |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To overcome the problem that time and effort are spent since a laboratory technician needs to confirm abnormal reaction process data one by one and estimate an abnormal cause if an abnormality is suspected in an apparatus, a sample and a reagent. <P>SOLUTION: An abnormality determination assistance method includes: an index calculating means for applying a preset evaluation formula to time-series data of a photometrical value, and calculating an index for indicating the characteristic quantity of a particular waveform; a relative index calculating means for calculating a value for indicating a relationship between the previously-calculated index and the index of target data; and an index displaying means for simultaneously displaying the value calculated by the index calculating means and the value calculated by the relative index calculating means. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
申请公布号 |
JP2010008402(A) |
申请公布日期 |
2010.01.14 |
申请号 |
JP20090094057 |
申请日期 |
2009.04.08 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
MITSUYAMA SATOSHI;FUKUYAMA SUKETAKA;TAKADA HIDEKATSU;BAN HIDEYUKI;MIMURA TOMONORI |
分类号 |
G01N35/00 |
主分类号 |
G01N35/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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