发明名称 |
X-RAY FLUORESCENCE ANALYSIS METHOD AND SYSTEM |
摘要 |
The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions. |
申请公布号 |
EP1783483(A4) |
申请公布日期 |
2010.01.06 |
申请号 |
EP20050761705 |
申请日期 |
2005.07.21 |
申请人 |
PANASONIC CORPORATION |
发明人 |
TANI, YOSHIYUKI;IWAMOTO, HIROSHI;HISAZUMI, TAKAO;IWATA, YUKIHIRO;SAKAGUCHI, ETSUYOSHI |
分类号 |
G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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