发明名称 METHOD OF MEASUREMENT OF RESONANCE FREQUENCIES
摘要 FIELD: measuring technology. ^ SUBSTANCE: invention refers to measuring technology and can be implemented for control over quality of micro-mechanical elements. The method of measurement of micro electro-mechanical system - MEMS consists in fastening MEMS on a movable part of a shake table driven to oscillatory motion with alternate frequency; further radiation from a linear source of light is directed to MEMS, also axis along longer side of the linear source of light is parallel to axis of MEMS rotation; a reflected image in form of line is controlled; notably, resonance moment is fixed by maximal value of width of line reflected from controlled MEMS. ^ EFFECT: upgraded accuracy of MEMS element control, decreased time of measurement. ^ 2 dwg
申请公布号 RU2377509(C1) 申请公布日期 2009.12.27
申请号 RU20080139222 申请日期 2008.10.03
申请人 GOSUDARSTVENNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA MOSKOVSKIJ GOSUDARSTVENNYJ INSTITUT EHLEKTRONNOJ TEKHNIKI (TEKHNICHESKIJ UNIVERSITET) 发明人 LAPENKO VADIM NIKOLAEVICH;TIMOSHENKOV SERGEJ PETROVICH;KIK MIKHAIL ANDREEVICH;KIK DMITRIJ ANDREEVICH;PASJUTIN ANTON VIKTOROVICH;CHAPLYGIN JURIJ ALEKSANDROVICH
分类号 G01H9/00;G01H13/00 主分类号 G01H9/00
代理机构 代理人
主权项
地址