发明名称 TESTING SYSTEM FOR READING ERROR CORRECTING FUNCTION
摘要 PURPOSE:To enable correction of reading error by a pseudo input/output device and facilitate testing, by using an IC in place of a reading medium of an input/ output device and performing correction of errors when the frequency of occurrence of errors attains a required frequency. CONSTITUTION:A pseudo input/output device consisting of an IC memory 2 that is substitutive for the reading medium of an input/output device 1 and a controlling section 3 is connected to a channel device CHC or an input/output controlling device IOC. Error address is written in an error address register 5 from outside. This address and address generated successively from an error address generator 4 are compared and when the two addresses are coincident, an error generation signal is generated from FF11. When the frequency of generation of errors thus detected attains a set value set in a setting circuit 9, a frequency comparator circuit 10 operates to correct the error, and confirms the operation of the channel device CHC or the input/output controlling device IOC.
申请公布号 JPS5827220(A) 申请公布日期 1983.02.17
申请号 JP19810124520 申请日期 1981.08.08
申请人 FUJITSU KK 发明人 ADACHI YUUTA
分类号 G06F11/08;G06F11/00;G06F13/00 主分类号 G06F11/08
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