发明名称 Cleaning method of semiconductor manufacturing apparatus and semiconductor manufacturing apparatus
摘要 A cleaning method of a semiconductor manufacturing apparatus begins by introducing film forming gas include reaction gas not forming a film by itself to reaction chamber to form the film on a semiconductor substrate, decreasing pressure of the reaction chamber, solidifying or liquefying the reaction gas to form particles by using small-particles in the reaction chamber as cores, and exhausting the particles from the reaction chamber. Using this method, foreign small-particles can easily be removed from the apparatus and suppress any possible contamination of semiconductor substrates to be processed.
申请公布号 US7631651(B2) 申请公布日期 2009.12.15
申请号 US20060469724 申请日期 2006.09.01
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 FURUSAWA TAKAYUKI
分类号 B08B9/00 主分类号 B08B9/00
代理机构 代理人
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