发明名称 TEST SYSTEM AND PROBER ASSEMBLY FOR TESTING A LARGE AREA SUBSTRATE
摘要 PURPOSE: A test system for testing a large-sized substrate and a prober assembly are provided to minimize the venting and pump stop time by providing two or more probers in a test chamber. CONSTITUTION: A prober(205B) includes a frame(303) and six contact head assemblies(318). The prober has a plurality of motors(505) combined with the contact head assemblies. The frame includes a plurality of stepped portions(508A-508B) for performing the switching of alignment of contact heads of the contact head assemblies. The frame has the first length(L1) for forming the moving range of the contact head assemblies along the frame.
申请公布号 KR20090120444(A) 申请公布日期 2009.11.24
申请号 KR20090101382 申请日期 2009.10.23
申请人 APPLIED MATERIALS INC. 发明人 JOHNSTON BENJAMIN M.;KRISHNASWAMI SRIRAM;NGUYEN HUNG T.;BRUNNER MATTHIAS;LIU YONG;BEATON WILLIAM;LEDL LUDWIG F.;SCHMID RALF
分类号 G01R1/073;G01R1/06 主分类号 G01R1/073
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