发明名称 CIRCUIT STRUCTURE AND PHOTOMASK FOR DEFINING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a circuit structure and a photomask for the circuit structure, the photomask pattern including lines and pickup pads that can be more easily corrected by OPC (optical proximity correction) than by conventional techniques. <P>SOLUTION: A circuit structure and a photomask for defining the circuit structure are provided. The circuit structure includes a plurality of pickup pads 320 and a plurality of lines 310 in parallel, in which a part of the lines contiguously arranged are each disposed with a pickup pad. The pickup pad of any line disposed with a pickup pad is connected, through a discontinuity point 330 of a neighboring line at one side of the line, to a next line. The photomask has thereon a plurality of line patterns for defining the above lines and a plurality of pickup pad defining patterns for defining the above pickup pads. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2009271261(A) 申请公布日期 2009.11.19
申请号 JP20080120645 申请日期 2008.05.02
申请人 POWERCHIP SEMICONDUCTOR CORP 发明人 TU TE-HUNG;CHEN KAO-TUN
分类号 G03F1/36;G03F1/68;G03F1/70;H01L21/3205;H01L21/768;H01L21/82;H01L23/52;H01L23/522 主分类号 G03F1/36
代理机构 代理人
主权项
地址