发明名称 Lithographic system, device manufacturing method, and mask optimization method
摘要 A lithographic system comprises an array of individually controllable elements, a projection system, datapath hardware, and a conversion system. The array of individually controllable elements is capable of modulating a radiation beam. The projection system is configured to project the modulated radiation beam onto a target portion of a substrate. The datapath hardware converts an input pattern file into a control signal for controlling the array of individually controllable elements. The conversion system is configured to convert a requested device layout pattern into an input pattern file for the datapath hardware. The input pattern file is a spatial-frequency-restricted representation of the requested device layout pattern.
申请公布号 US2008068569(A1) 申请公布日期 2008.03.20
申请号 US20060522533 申请日期 2006.09.18
申请人 ASML NETHERLANDS B.V. 发明人 MULCKHUYSE WOUTER FRANS WILLEM;TINNEMANS PATRICIUS ALOYSIUS JACOBUS
分类号 G03B27/42 主分类号 G03B27/42
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