发明名称 METHOD FOR FABRICATING PASE SHIFT MASK
摘要 <p>PURPOSE: A method for preparing a phase shift mask is provided to effectively remove a resist without the change of transmissivity of the phase shift mask. CONSTITUTION: A method for preparing a phase shift mask comprises the steps of: forming a phase shift film and light screening film on a transparent substrate; forming a resist pattern on a light shield layer; etching the light shield layer and the phase shift mask using resist pattern as a mask; loading the substrate inside ICP(Inductively Coupled Plasma); forming plasma by introducing reaction gas inside the etching equipment; and removing the resist pattern by minimizing bias power and applying incident power.</p>
申请公布号 KR20090117167(A) 申请公布日期 2009.11.12
申请号 KR20080043082 申请日期 2008.05.08
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, MUN SIK
分类号 G03F1/26;H01L21/027 主分类号 G03F1/26
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