发明名称 Interpenetrating network for chemical mechanical polishing
摘要 Chemical mechanical polishing pads are provided, wherein the chemical mechanical polishing pads have a polishing layer comprising an interpenetrating network including a continuous non-fugitive phase and a substantially co-continuous fugitive phase. Also provided are methods of making the chemical mechanical polishing pads and for using them to polish substrates.
申请公布号 US2009280725(A1) 申请公布日期 2009.11.12
申请号 US20090504189 申请日期 2009.07.16
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 发明人 MULDOWNEY GREGORY P
分类号 B24B1/00;B24D99/00;B24B37/04 主分类号 B24B1/00
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