发明名称 TANDEM MASS SPECTROMETER
摘要 A tandem mass spectrometer includes a two-dimensional ion trap that has an elongated ion-trapping region extending along a continuously curving path between first and second opposite ends thereof. The elongated trapping region has a central axis that is defined substantially parallel to the curved path and that extends between the first and second opposite ends. The two-dimensional ion trap is configured for receiving ions through the first end and for mass selectively ejecting the ions along a direction that is orthogonal to the central axis, such that the ejected ions are directed generally toward a common point. The tandem mass spectrometer also includes a collision cell having an ion inlet that is disposed about the common point for receiving the ions that are ejected therefrom and for causing at least a portion of the ions to undergo collisions and form product ions by fragmentation. A mass analyzer in communication with the collision cell receives the product ions from the collision cell and obtains product ion mass spectra with a rapid scan rate. In this way, a plurality of product ion spectra may be obtained for a large number of precursor ions in a sample without the need for data-dependent operation.
申请公布号 EP2115765(A2) 申请公布日期 2009.11.11
申请号 EP20080729202 申请日期 2008.02.06
申请人 THERMO FINNIGAN LLC 发明人 SENKO, MICHAEL, W.
分类号 H01J49/42 主分类号 H01J49/42
代理机构 代理人
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