发明名称 Photoresist coating composition and method for forming fine pattern using the same
摘要 A photoresist coating composition that includes a compound represented by Formula 1 and an aqueous solvent, and a method for forming a fine pattern by coating the composition on a photoresist pattern to effectively reduce a size of a photoresist contact hole and a space, which can be applied to all semiconductor processes.
申请公布号 US7615338(B2) 申请公布日期 2009.11.10
申请号 US20050298385 申请日期 2005.12.08
申请人 HYNIX SEMICONDUCTOR INC.;YOUNGCHANG CHEMICAL CO., LTD. 发明人 LEE GEUN SU;MOON SEUNG CHAN;LEE SEUNG HUN
分类号 G03C1/73;G03F7/26;G03F7/36 主分类号 G03C1/73
代理机构 代理人
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