发明名称 Method for forming a capacitor structure
摘要 A method for forming a capacitor structure, according to which the following consecutive steps are executed: providing a substrate having on its surface contact pads and a dielectric mold provided with at least one trench leaving exposed the contact pads; forming a first conductive layer on side walls of the trench in a top region of the trench the conductive layer being without contact to the contact pads; depositing a first dielectric layer; depositing a second conductive layer on the contact pad and on the side walls of the trench; depositing a second dielectric layer; depositing a third conductive layer; and forming a vertical plug interconnecting the first conductive layer and the third conductive layer.
申请公布号 US7615444(B2) 申请公布日期 2009.11.10
申请号 US20060477581 申请日期 2006.06.29
申请人 QIMONDA AG 发明人 WUNNICKE ODO;MOLL PETER;SCHUPKE KRISTIN
分类号 H01L21/8242 主分类号 H01L21/8242
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