Semiconductor Integrated Circuit And Multi Test Method Thereof,申请号KR20080013560-传众专利搜索

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发明名称	Semiconductor Integrated Circuit And Multi Test Method Thereof
摘要
申请公布号	KR100925375(B1)	申请公布日期	2009.11.09
申请号	KR20080013560	申请日期	2008.02.14
申请人		发明人
分类号	G11C29/00;G11C7/10;G11C7/22;G11C8/10	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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