发明名称 METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 Forming a capacitor of a semiconductor device includes forming an interlayer dielectric having holes over a semiconductor substrate. A conductive layer is then formed on surfaces of the holes and on the upper surface of the interlayer dielectric. A silicon-containing conductive layer is formed by flowing a silicon source gas for the semiconductor substrate formed with the conductive layer, so that silicon atoms can penetrate into the conductive layer. The silicon-containing conductive layer prevents etchant from infiltrating the interlayer dielectric below the silicon-containing conductive layer.
申请公布号 US2009275186(A1) 申请公布日期 2009.11.05
申请号 US20080265759 申请日期 2008.11.06
申请人 PARK CHEOL HWAN;CHO HO JIN;KIM JAE SOO;LEE DONG KYUN 发明人 PARK CHEOL HWAN;CHO HO JIN;KIM JAE SOO;LEE DONG KYUN
分类号 H01L21/02 主分类号 H01L21/02
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