MEMORY TEST SYSTEM HAVING FAIL JUDGMENT APPARATUS AND METHOD FOR JUDGING FAIL OF DEVICES IN MEMORY TEST SYSTEM

摘要

PURPOSE: A memory test system including a defect determination apparatus and a defect determination method of the device in the memory test system are provided to progress a test at high speed by confirming the defect of each memory device without using the defect memory. CONSTITUTION: A test board(210) generates test signal. An input-output sharing device(220) outputs test data and inputs memory devices for testing the test signal. A defect determination device(400) determines whether to be defect of the memory device. The defect determination device includes a plurality of registers. A plurality of registers stores and classifies a defect determination result by each memory device.