发明名称 CHROMATOGRAPHIC INSPECTION APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a chromatographic inspection apparatus for detecting and accurately correcting coloration unevenness of a coloration area of a chromatographic test piece. Ž<P>SOLUTION: The chromatographic inspection apparatus reads scattered reflected light from the chromatographic test piece 5 by an imaging element 16 in an imaging optical system 17 arranged to have an inclination angle θ with respect to the chromatographic test piece 5. A prism 12 is disposed on the incident side of a condensing lens 13 and an imaging lens 14 for forming an image on the imaging element 16, and a wedge angle and an arrangement rotation angle of the prism 12 are set corresponding to the inclination angle θ to correct the optical path length difference of the imaging optical system in the coloration area 11 and to detect and accurately correct the coloration unevenness of the coloration area 11. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009258028(A) 申请公布日期 2009.11.05
申请号 JP20080109695 申请日期 2008.04.21
申请人 PANASONIC CORP 发明人 ONISHI SEIJI
分类号 G01N21/17 主分类号 G01N21/17
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