发明名称
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a highly reliable semiconductor device and a manufacturing method thereof. <P>SOLUTION: The semiconductor device has a semiconductor substrate 10 having an electrode 14 formed thereon; a resin layer 20 formed so as to avoid the electrode 14; a land 32 provided on the resin layer 20; a wiring 34 for electrically connecting the electrode 14 to the land 32; and an external terminal 40 joined to the land 32. The resin layer 20 includes a first resin portion 22 supporting an end while avoiding the center portion of a joining surface 35 of the land 32 to the external terminal 40; and a second resin portion 24 adjacent to the first resin portion 22. The first resin portion 22 has an elastic modulus lower than that of the second resin portion 24. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP4359785(B2) 申请公布日期 2009.11.04
申请号 JP20070009984 申请日期 2007.01.19
申请人 发明人
分类号 H01L23/12 主分类号 H01L23/12
代理机构 代理人
主权项
地址