发明名称 |
METHOD OF EXTRACTING STRESS-STRAIN BEHAVIOR OF MICRO/NANO SCALE STRUCTURE |
摘要 |
PURPOSE: A method of extracting stress-strain relation of micro/nano scale structure is provided to amend an error in the measuring of mechanical property. CONSTITUTION: Load and displacement of a microstructure are experimentally measured. An entry value of a stress-strain is assumed using the measured load and the displacement. The load and displacement are calculated by analyzing a finite-element based on the entry value of the supposed stress-strain. The stress-strain relation is revised using a following equation if it exceeds a preset error range that the load and displacement computed based on the finite-element and the load and displacement experimentally measured. The load and displacement are calculated by a analyzing the finite-element based on revised stress-strain relation.
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申请公布号 |
KR20090112369(A) |
申请公布日期 |
2009.10.28 |
申请号 |
KR20080038217 |
申请日期 |
2008.04.24 |
申请人 |
KOREA INSTITUTE OF MACHINERY & MATERIALS |
发明人 |
KIM, JAE HYUN;LEE, HAK JOO;PARK, JUNG MIN;CHOI, BYUNG IK |
分类号 |
G01L1/00;G01L1/14;G01L1/24 |
主分类号 |
G01L1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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