发明名称 Wideband high impedance card-mountable probe.
摘要 <p>An active electrical test probe with wideband frequency capability for use on a test probe card, along with other test probes. A small hybrid integrated circuit is mounted on a substrate held on edge, adjacent the probe tip contact element of the probe, by a conductive metal clip. The circuit is provided power from an external source. Signals received by the probe tip are transmitted, as modified by the hybrid integrated circuit, through an output cable to electronic test equipment.</p>
申请公布号 EP0257833(A2) 申请公布日期 1988.03.02
申请号 EP19870306812 申请日期 1987.07.31
申请人 TEKTRONIX, INC. 发明人 HARRY, EMORY J.;HADWIN, MATTHEW J.;GARCIA, JOHN D.
分类号 G01R1/073;G01R1/067;G01R31/28 主分类号 G01R1/073
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