| 摘要 |
PURPOSE: A probe card is provided to easily join the card body and the silicon material by forming a penetration hole using an etching. CONSTITUTION: A probe card comprises a circuit board for test, a card body, a probe, and a cover(40). The card body is combined with the upper side of the circuit board for test by forming in the combining aperture perpendicularly passed through. The probe connects the electrode pad of the solder bump and the circuit board for test by being combined with the combining aperture. A penetration hole(42) is formed that the probe is protruded into the upper part. The penetration hole is formed through the etching process.
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