摘要 |
<p>A lithographic apparatus is described that comprises a support structure (300) to hold an object (210). The object may be a patterning device or a substrate to be exposed. The support structure comprises a chuck (321), on which the object is supported, and an array of shear- compliant elongated elements (325) normal to the chuck and the stage (230), such that first ends of the elongated elements contact a surface of the chuck and second ends of the elongated elements contact a stage. Through using the array of elongated elements, a transfer of stress between the stage and the chuck is substantially uniform, resulting in minimization of slippage of the object relative to the surface of the chuck during a deformation of the chuck due to the stress.</p> |
申请人 |
ASML HOLDING N.V.;NAYFEH, SAMIR, A.;WILLIAMS, MARK, EDD;VERDIRAME, JUSTIN, MATTHEW |
发明人 |
NAYFEH, SAMIR, A.;WILLIAMS, MARK, EDD;VERDIRAME, JUSTIN, MATTHEW |