发明名称 SHEAR-LAYER CHUCK FOR LITHOGRAPHIC APPARATUS
摘要 <p>A lithographic apparatus is described that comprises a support structure (300) to hold an object (210). The object may be a patterning device or a substrate to be exposed. The support structure comprises a chuck (321), on which the object is supported, and an array of shear- compliant elongated elements (325) normal to the chuck and the stage (230), such that first ends of the elongated elements contact a surface of the chuck and second ends of the elongated elements contact a stage. Through using the array of elongated elements, a transfer of stress between the stage and the chuck is substantially uniform, resulting in minimization of slippage of the object relative to the surface of the chuck during a deformation of the chuck due to the stress.</p>
申请公布号 WO2009124732(A1) 申请公布日期 2009.10.15
申请号 WO2009EP02577 申请日期 2009.04.07
申请人 ASML HOLDING N.V.;NAYFEH, SAMIR, A.;WILLIAMS, MARK, EDD;VERDIRAME, JUSTIN, MATTHEW 发明人 NAYFEH, SAMIR, A.;WILLIAMS, MARK, EDD;VERDIRAME, JUSTIN, MATTHEW
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项
地址