发明名称 METHOD OF MANUFACTURING GALLIUM NITRIDE BASED LIGHT EMITTING DIODE HAVING SURFACE IRREGULARITIES
摘要 An n-type GaN layer is formed on a substrate, and an active layer is formed on the n-type GaN layer. A p-type GaN layer is formed on the active layer, and portions of the p-type GaN layer and the active layer are mesa-etched so as to expose a portion of the n-type GaN layer. An irregularities forming layer is formed on the p-type GaN layer and a photosensitive film pattern for forming a surface irregularities pattern is formed on the irregularities forming layer. The irregularities forming layer is selectively wet-etched by using the photosensitive film pattern as an etching mask, thereby forming surface irregularities. A p-electrode is formed on the p-type GaN layer having the surface irregularities formed thereon, and an n-electrode is formed on the exposed n-type GaN layer."
申请公布号 US2009258454(A1) 申请公布日期 2009.10.15
申请号 US20090490891 申请日期 2009.06.24
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 KIM DAE YEON;HWANG SUNG MIN;LEE JIN BOCK;YOON SANG HO
分类号 H01L21/20;H01L33/14;H01L33/22;H01L33/32 主分类号 H01L21/20
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