发明名称 GATE STRUCTURE, METHOD OF MANUFACTURING THE GATE STRUCTURE AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE HAVING THE GATE STRUCTURE
摘要 PURPOSE: A gate structure, method of manufacturing the gate structure and a method of manufacturing a semiconductor device having the gate structure are provided to prevent contact between a gate electrode and a plug even if the gate electrode and the plug are formed between gate electrodes which are separated from each other by a short distance. CONSTITUTION: A gate structure(142) includes a gate dielectric layer pattern(110), a gate electrode(114), a first spacer(122), and a passivation layer pattern(132). The gate dielectric layer pattern is formed on the substrate(100), and the gate electrode is formed on the gate insulating layer pattern. A gate electrode includes a lower middle, and upper part: the lower part has a first width(L1), and the central part has a second width(L2) narrower than the first widths. The upper part has a third widths. The first spacer is formed on the lower-sidewall of the gate electrode. The passivation layer pattern is formed on the side wall of the middle part at the gate electrode.
申请公布号 KR20090107205(A) 申请公布日期 2009.10.13
申请号 KR20080032595 申请日期 2008.04.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SUN, MIN CHUL;KIM, JONG PYO
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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