发明名称 EVALUATION METHOD FOR CHIP ELECTRONIC PARTS
摘要 <P>PROBLEM TO BE SOLVED: To provide an evaluation method for evaluating the wettability of solder to an electrode terminal at a chip electronic parts, according to a criterion based on behavior of the chip electronic parts in packaging. <P>SOLUTION: The method for evaluating the chip electronic parts, comprising the processes of: a process for preparing a substrate comprising a pair of land patterns; an application process for applying soldering paste to the land patterns; a process for preparing a chip electronic parts comprising a pair of electrode portions; an installation process for installing the chip electronic parts at a predetermined position different from a reference position on the substrate after the application process; a melting process for heating the substrate to melt the soldering paste applied to the land patterns after the installation process; and a measuring process for measuring the position of the chip electronic parts after the melting process. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009231782(A) 申请公布日期 2009.10.08
申请号 JP20080078788 申请日期 2008.03.25
申请人 TDK CORP 发明人 OGASAWARA SUKEYUKI;DOMON TAKAAKI;SATO YUTAKA
分类号 H05K3/34;H05K13/08 主分类号 H05K3/34
代理机构 代理人
主权项
地址