| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection chip producing method capable of detecting a specimen with high sensitivity. SOLUTION: The method includes an abutting step of abutting a sample including metallic particles having dimensions permitting excitation of localized plasmons and the specimen to a detection surface, a collecting step of capturing at least the metallic particles by irradiating capturing light to the sample abutting on the detection surface and collecting the metallic particles in a plasmon reinforcement region where a plasmon reinforcement field is formed on the detection surface by the light capturing effect, a measuring step of measuring intensity of optical physical properties from the plasmon reinforcement region of the detection surface by irradiating exciting light to the plasmon reinforcement region of the detection surface where the metallic particles are collected, and a detecting step of detecting the specimen included in the sample based on the intensity of the optical physical properties measured by the measuring step. COPYRIGHT: (C)2010,JPO&INPIT
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