发明名称 INSPECTION JIG
摘要 PURPOSE: A test jig is provided to facilitate the measurement of contact resistance by reducing the conductor resistance of a wiring part of a connected object as much as possible. CONSTITUTION: A test jig is used when measuring the electric resistance between measured objects(8,9). The test jig comprises a pair of levers(1,2), a pair of contactors(13,23) and a supporting unit(4). The levers face each other with a preset interval. The contactors are supported by the levers at different positions. The supporting unit support the levers so as to approach to each other, and maks the contactors come in contact with the measured objects.
申请公布号 KR20090102648(A) 申请公布日期 2009.09.30
申请号 KR20090022503 申请日期 2009.03.17
申请人 NEC INFRONTIA CORPORATION 发明人 YAMASHITA SHUNICHI
分类号 G01R27/02;G01R31/00 主分类号 G01R27/02
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