发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT FOR SUPPORTING A TEST MODE |
摘要 |
A semiconductor integrated circuit for supporting a test mode includes a program region including at least one One Time Programmable Cell Array, and a program region control unit configured to activate the program region in response to an enabled fuse signal of a fuse corresponding to the program region, and to activate the program region in response to a test mode signal of the program region.
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申请公布号 |
US2009231901(A1) |
申请公布日期 |
2009.09.17 |
申请号 |
US20080327730 |
申请日期 |
2008.12.03 |
申请人 |
HYNIX SEMICONDUCTOR, INC. |
发明人 |
KIM TAEK SEUNG |
分类号 |
G11C17/16;G11C8/00;G11C8/10;G11C29/00 |
主分类号 |
G11C17/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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