发明名称 EVALUATION METHOD, EVALUATION APPARATUS, AND EXPOSURE DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To evaluate the optical characteristics of an inspected optical system more simply with higher accuracy. <P>SOLUTION: An evaluation method for evaluating the optical characteristics of the inspected optical system by using an interferometer includes: a first imaging process (1801) for imaging a first interference fringe acquired by the interferometer in a state where the disposition of movable elements of the interferometer in the optical axis direction of the optical system is a first disposition; a second imaging process (1803) for imaging a second interference fringe acquired by the interferometer in a state where the disposition of the movable elements in the axis direction is a second disposition; a determination process (1805) for determining the pupil center coordinates of the optical system based on the first and second interference fringes; and a calculation process for calculating the optical characteristics of the optical system by using the center coordinates determined in the determination process. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009210359(A) 申请公布日期 2009.09.17
申请号 JP20080052581 申请日期 2008.03.03
申请人 CANON INC 发明人 KOREUCHI OSAMU
分类号 G01M11/02;G03F7/20;H01L21/027 主分类号 G01M11/02
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