发明名称 EPITAXIAL WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide an epitaxial wafer having a structure of an optimum p-type layer capable of further improving an optical output and forming a favorable ohmic electrode. <P>SOLUTION: The epitaxial wafer has at least a substrate, and an n-type layer formed on the substrate by an epitaxial growth and a p-type layer on the n-type layer. The n-type layer and the p-type layer are GaAsP or GaP, and the p-type layer has at least a first p-type layer and a second p-type layer over the first p-type layer. The carrier density of the first p-type layer of the epitaxial wafer is 5&times;10<SP>16</SP>to 3&times;10<SP>17</SP>/cm<SP>3</SP>, and the carrier density of the second p-type layer of the epitaxial wafer is 7&times;10<SP>18</SP>to 3&times;10<SP>19</SP>/cm<SP>3</SP>. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009212112(A) 申请公布日期 2009.09.17
申请号 JP20080050446 申请日期 2008.02.29
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 SHINOHARA MASAYUKI;IKEDA ATSUSHI;ORIMO SHINJI
分类号 H01L21/205;H01L33/14;H01L33/30 主分类号 H01L21/205
代理机构 代理人
主权项
地址