发明名称 RADIO FREQUENCY TESTING SYSTEM AND TESTING CIRCUIT UTILIZED THEREBY
摘要 A radio frequency (RF) testing system (100) includes a RF signal source (10) generating RF signals, an antenna (50), a RF testing circuit (40) disposed on a printed circuit board (PCB) (41), a testing probe (20) for receiving the RF signal from the RF testing circuit, and a testing apparatus (30) for testing the RF signals from the testing probe. The RF testing circuit includes a first pad (42), a second pad (44), a transmission line (48), and at least one ground portion (49) parallel to the transmission line. A distance between a first region defined by the first pad and a second region defined by the second pad positioned between the first region and the antenna is equal to one-fourth of the wavelength. During testing, the testing probe is electrically connected to the first pad, and the second pad is electrically connected to ground of the PCB.
申请公布号 US2009224786(A1) 申请公布日期 2009.09.10
申请号 US20080185110 申请日期 2008.08.03
申请人 HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 WU CHENG-YU;YAN TAO
分类号 G01R31/02 主分类号 G01R31/02
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