发明名称 Fuse cutting test circuit, fuse cutting test method, and semiconductor circuit
摘要 A fuse cutting test method to test the state of a fuse includes measuring the current flowing through the fuse and determining the fuse to be either broken, or not broken, or in a state therebetween, based on the measured current.
申请公布号 US7573273(B2) 申请公布日期 2009.08.11
申请号 US20060440071 申请日期 2006.05.25
申请人 NEC ELECTRONICS CORPORATION 发明人 YANAGIDA TAKAO
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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