| 摘要 |
There is provided a temperature detecting apparatus for improving operational characteristics, which vary according to the temperature, of elements in a semiconductor memory device. The temperature detecting apparatus of the present invention includes: a first oscillator that outputs a first oscillating signal in response to a first oscillator reset signal, the first oscillating signal being independent of the temperature; a second oscillator that outputs a second oscillating signal in response to a second oscillator enable signal, the second oscillating signal being dependent on the temperature; a comparator that compares an output pulse of the first oscillator with an output pulse of the second oscillator and then outputs a temperature detection comparison signal; and an output unit that outputs a temperature detection signal in response to an input of the temperature detection comparison signals.
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