| 摘要 |
The invention relates to a method for generating and visualizing an ion beam profile, the method comprising the following steps:
- Specifying an incidence direction (55) of a particle beam,
- Specifying a target region (53) that is to be irradiated by said particle beam,
- Creating an ion beam profile from points
that are located on a downstream side (57) of said target region (53) or
that are located in front of said target region (53) and project onto the contour of said target region (53) with respect to said incidence direction (55),
- Displaying a graphical representation of said ion beam profile. |
