| 摘要 |
A chip data providing system is provided. The chip data providing system is equipped with an inspection device for inspecting each chip after processing steps of forming integrated circuits on a plurality chips included in a semiconductor wafer are completed, an inspection server that generates, based on an inspection result, first chip data including information concerning the inspection result of each of the chips, and a chip data providing server that generates, based on the first chip data generated by the inspection server and information concerning an assembly enterprise stored in advance, second chip data in a format suitable for a system of the assembly enterprise that selects and uses the plurality of chips included in the semiconductor wafer, and provides the second chip data to the assembly enterprise.
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