发明名称 SINGLE ENDED FLANGE PROBE
摘要 THE PRESENT INVENTION PROVIDES A SINGLE ENDED PROBE WHICH COMPRISES A SPRING-LOADED CONTACT PROBE FOR PLACEMENT WITHIN A BARREL (10) FOR PERFORMING ELECTRICAL TESTS ON DUT (14). THE SPRING-LOADED CONTACT PROBE CONSTRUCTED ACCORDING TO THE PRINCIPLES OF THE INVENTION INCLUDES A TOP PLUNGER (7) DISPOSED WITHIN THE BARREL. THE PLUNGER INCLUDES A TIP AT THE END POSITION OUTSIDE THE BARREL (10) FOR ELECTRICAL CONTACT WITH THE TEST PAD OF THE DUT (14). THERE EXISTS HEREIN A MECHANICAL METHOD FORCES DOWNWARD THROUGH THE SPRING, IN THE BARREL. CREATING A "PRE- LOADED" CONDITION FOR THE BOTIOM PLUNGER (13) WHEREIN THE BOTTOM PLUNGER ( 1 3) IS UNIFIED WITHIN THE BARREL (10). THE SAID PRE-LOADED PHENOMENON IS ACHIEVED BY HAVING A FLANGE ( 1 6) THAT PROTRUDES OUTWARD FROM THE TOP PLUNGER (7) THROUGH THE PLUNGER SHAFT ( 17).
申请公布号 MY138796(A) 申请公布日期 2009.07.31
申请号 MYPI20060074 申请日期 2006.01.09
申请人 TEST TOOLING SOLUTIONS (M) SDN BHD 发明人 OW CHIN HWEE
分类号 G01R1/067 主分类号 G01R1/067
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