发明名称 |
Process for identifying the location of a break in a scan chain in real time |
摘要 |
A process for identifying the location of a break in a scan chain in real time as fail data is collected from a tester. Processing a test pattern before applying it on a tester provides a signature enabling a method for a tester to identify a scan cell which is stuck during the time the tester is operating on a device under test rather than accumulating voluminous test data sets for delayed offline analysis.
|
申请公布号 |
US7568139(B2) |
申请公布日期 |
2009.07.28 |
申请号 |
US20060609899 |
申请日期 |
2006.12.12 |
申请人 |
INOVYS CORPORATION |
发明人 |
DOKKEN RICHARD C;CHAN GERALD S;ISHII TAKEHIKO |
分类号 |
G06F7/02 |
主分类号 |
G06F7/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|