发明名称 Verfahren zur Bestimmung der Centrality von Masken
摘要 A method for determining the centrality of masks is disclosed. The mask is positioned in a coordinate measuring device on a measurement table displaceable in a direction perpendicular to the optical axis of an imaging measurement system in an interferometrically measurable way. The position of a mask coordinate system with respect to the measuring device coordinate system is determined based on at lest two structures on the mask. The relative distance from one of the at least first and second outer edges to the at least two structures is determined. The coordinate measuring machine determines the actual coordinates of the at least two structures with respect to the respective outer edges, which must not exceed a predetermined deviation from a desired value.
申请公布号 DE102007049100(B4) 申请公布日期 2009.07.16
申请号 DE20071049100 申请日期 2007.10.11
申请人 VISTEC SEMICONDUCTOR SYSTEMS GMBH 发明人 HEIDEN, MICHAEL
分类号 G01B11/03;G01B11/00;G06T7/00 主分类号 G01B11/03
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