发明名称 |
SEMICONDUCTOR MEMORY DEVICES AND WEAR LEVELING METHODS THEREOF |
摘要 |
<p>A semiconductor memory device and a method for managing abrasion of the same are provided to improve performance and product life of the semiconductor memory device by applying an abrasion managing method according to abrasion condition. A semiconductor memory device(100) includes a non-volatile memory and a memory controller(120). The non-volatile memory has a plurality of memory blocks. Erasure frequency of each memory block is stored in at least one of the plurality of memory blocks. The memory controller manages abrasion of the non-volatile memory. The memory controller manages the cycle of abrasion management with reference to the erasure frequency.</p> |
申请公布号 |
KR20090077538(A) |
申请公布日期 |
2009.07.15 |
申请号 |
KR20080003547 |
申请日期 |
2008.01.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, TAE MIN |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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