发明名称 SEMICONDUCTOR MEMORY DEVICES AND WEAR LEVELING METHODS THEREOF
摘要 <p>A semiconductor memory device and a method for managing abrasion of the same are provided to improve performance and product life of the semiconductor memory device by applying an abrasion managing method according to abrasion condition. A semiconductor memory device(100) includes a non-volatile memory and a memory controller(120). The non-volatile memory has a plurality of memory blocks. Erasure frequency of each memory block is stored in at least one of the plurality of memory blocks. The memory controller manages abrasion of the non-volatile memory. The memory controller manages the cycle of abrasion management with reference to the erasure frequency.</p>
申请公布号 KR20090077538(A) 申请公布日期 2009.07.15
申请号 KR20080003547 申请日期 2008.01.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, TAE MIN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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