发明名称 Nonvolatile memory device and method of manufacturing the same
摘要 Provided are a nonvolatile memory device and a method of manufacturing the same. A floating gate electrode of the nonvolatile memory device may have a cross-shaped section as taken along a direction extending along a control gate electrode. The floating gate electrode may have an inverse T-shaped section as taken along a direction extending along an active region perpendicular to the control gate electrode. The floating gate electrode may include a lower gate pattern, a middle gate pattern and an upper gate pattern sequentially disposed on a gate insulation layer, in which the middle gate pattern is larger in width than the lower gate pattern and the upper gate pattern. A boundary between the middle gate pattern and the upper gate pattern may have a rounded corner.
申请公布号 US7560768(B2) 申请公布日期 2009.07.14
申请号 US20060594808 申请日期 2006.11.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KOH CHA-WON;CHUNG BYUNG-HONG;WOO SANG-GYUN;NAM JEONG-LIM;OH SEOK-HWAN;SONG JAI-HYUK;PARK HYUN;KANG YOOL
分类号 H01L29/788 主分类号 H01L29/788
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