发明名称 System and method for diagnostic test innovation
摘要 A method and system for performing diagnostic testing to speed the computer boot process. A boot process is initiated and an error counter value is read in any of memory, input/output, central processing, networking, mass storage, or other computing subsystems. The error counter values are compared to subsystem error thresholds. The method includes identifying subsets of subsystems with error counters exceeding error thresholds and then, performing diagnostic tests only on this subset of subsystems as part of the boot process. The error counter may be a correctable error counter that is incremented by an operating system error handler as it isolates subsystem errors. The method includes identifying subsystems in service less than a predefined time threshold by comparing a value stored in a power-on hours field in each subsystem to time thresholds, and including these modules in the tested subset.
申请公布号 US7555677(B1) 申请公布日期 2009.06.30
申请号 US20050112053 申请日期 2005.04.22
申请人 SUN MICROSYSTEMS, INC. 发明人 WILEY STEPHEN A.;RIGGS JAMIE D.
分类号 G06F11/00 主分类号 G06F11/00
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