发明名称 Method for detecting vertical transfer defects in image sensors
摘要 A charge transfer implemented by a transfer section for transferring charges stored in image sensor elements along one direction on a surface where the image sensor elements are disposed is halted for a predetermined length of time. The charges are transferred from the transfer section without reading the charges from the image sensor elements after the charge transfer is halted for the predetermined length of time. A position where a defect is generated in an image pickup sensor is identified based on signal levels of the transferred charges. A defective signal level of the image pickup sensor generated on a line including the defect-generating position and in parallel with the one direction is corrected. As a result of the foregoing process, a display failure is precisely corrected.
申请公布号 US7551213(B2) 申请公布日期 2009.06.23
申请号 US20050127250 申请日期 2005.05.12
申请人 PANASONIC CORPORATION 发明人 NAKASHIMA TOSHIYUKI;KOGISHI TOSHIYA;ARAKAWA KENJI;HATANO TOSHINOBU;KAJIWARA JUN
分类号 H01L27/148;H04N9/64;H04N3/14;H04N5/335;H04N5/341;H04N5/361;H04N5/367;H04N5/369 主分类号 H01L27/148
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